Part Number Hot Search : 
CS5541 IDT72 300HS A2188 B59062 DO1605T LAA120S C3510W
Product Description
Full Text Search
 

To Download TA1204AF Datasheet File

  If you can't view the Datasheet, Please click here to try to view without PDF Reader .  
 
 


  Datasheet File OCR Text:
  TA1204AF 2001-02-07 1/25 toshiba bipolar linear integrated circuit silicon monolithic TA1204AF correction ic for lcd tv TA1204AF is correction ic, that have common drive circuit, for small or medium tft panel (normally white). TA1204AF is flat 44 pin package. TA1204AF have two linear rgb inputs. features two linear rgb inputs selectable dc coupling or ac coupling (pedestal clamp) input for both inputs correction circuit with rgb fine adjustments drive gain control circuit with rgb fine adjustments cutoff level control circuit with rgb fine adjustments brightness and contrast control circuits ac and dc controls for the common electrode pre-drive output circuit with feedback input for common electrode rgb output with horizontal and / or vertical reverse circuit weight: 1.15g (typ.) tentative ? toshiba is continually working to improve the quality and reliability of its products. nevertheless, semiconductor devices in g eneral can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. it is the responsibi lity of the buyer, when utilizing toshiba products, to comply with the standards of safety in making a safe design for the entire system, a nd to avoid situations in which a malfunction or failure of such toshiba products could cause loss of human life, bodily injury o r damage to property. in developing your designs, please ensure that toshiba products are used within specified operating ranges as set forth in the most recent toshiba products specifications. also, please keep in mind the precautions and conditions set forth in the ?handlin g guide for semiconductor devices,? or ?toshiba semiconductor reliability handbook? etc.. ? the toshiba products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). these toshiba products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfun ction o r failure of which may cause loss of human life or bodily injury (?unintended usage?). unintended usage include atomic energ y control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion cont rol instruments, medical instruments, all types of safety devices, etc.. unintended usage of toshiba products listed in this docume n t shall be made at the customer?s own risk. ? the products described in this document are subject to the foreign exchange and foreign trade laws. ? the information contained herein is presented only as a guide for the applications of our products. no responsibility is assume d b y toshiba corporation for any infringements of intellectual property or other rights of the third parties which may result from i ts use. no license is granted by implication or otherwise under any intellectual property or other rights of toshiba corporation o r others. ? the information contained herein is subject to change without notice. 000707 eba1
TA1204AF 2001-02-07 2/25 block diagram
TA1204AF 2001-02-07 3/25 pin function pin no. pin name function interface circuit input / output signal 2 a / b select switches input. do not leave open. do not switch duration from 2s before, to 4s after clamp pulse a / b. if pin 2 is not in use, fixed to v cc (5v) or gnd. 3 4 cp a in cp b in inputs clamp pulse. set clamp pulse width to at least 2s. if pin 3 or 4 is not in use, fix to gnd. 5 gnd gnd pin for block to which power is supplied from v dd pin. connect to 17 and 39 gnd pins using short thick line. D D 6 v inv. switches vertical polarity inverted phase. switching between pins 6 and 7 switches rgb and vcom outputs. do not leave open. if pin 6 is not in use, fixed to v cc (5v) or gnd. 7 pol in input polarity signal. if pin 7 is not in use, fixed to v cc (5v) or gnd. when pin 6 is high : h : negative polarity output; vcom output is high. l : positive polarity output; vcom output is low. when pin 6 is low : h : positive polarity output; vcom output is high. l : negative polarity output; vcom output is low.
TA1204AF 2001-02-07 4/25 pin no. pin name function interface circuit input / output signal 8 comm cent adjusts common output center voltage. when left open, biased 5v. voltage on this pin is used as common output center voltage. dc input adjustable voltage range : 0.3 to 11v 9 v dd (+13v) v dd pin connect 13v (typ.). depending on rgb output load or adjustment conditions, oscillation waveform may appear on output pin. thus, connect a bypass capacitor near this pin. D D 11 comm amp adjusts common output amplitude. when left open, biased 2.5v. when voltage is adjusted to 2.5v, amplitude of comm fb is about 5vp-p. dc current input : ? 0.2ma (sink current) to 1.25ma (source current) vcom amplitude : 0vp-p to 8.8vp-p 10 comm f.b. inputs common output feedback signal. connect common output buffer. maximum output current : 250a. control comm out pin waveform so that common drive waveform input to this pin has center voltage and amplitude which are set by comm cent and comm amp pins. 12 comm out outputs drive signal for common output buffer. connect common drive buffer.
TA1204AF 2001-02-07 5/25 pin no. pin name function interface circuit input / output signal 13 16 20 r fbl g fbl b fbl connect filter for canceling positive offset in relation to each axis. dc 14 19 21 r out g out b out outputs r / g / b signal. up to 300pf capacity can be driven. 15 18 22 r fbh g fbh b fbh connect filter for canceling negative offset in relation to each axis. dc 17 gnd gnd pin for block to which power is supplied from v dd pin. connect to 5 and 39 gnd pins using short thick line. D D 23 v0 cent. adjusts output signal center voltage. when left open, biased 1 / 2v dd . voltage on this pin is used as common output center voltage. dc input adjustable voltage range : 1 to 11.4v
TA1204AF 2001-02-07 6/25 pin no. pin name function interface circuit input / output signal 24 26 r cutoff b cutoff fine-adjusts cutoff voltage for r / b axis. when left open, biased 2.5v. when voltage is adjusted to 2.5v, cutoff fine voltage is 0v (typ.) in relation to g axis. dc input 0 to 5v cutoff voltage : ? 2 to 2v 25 com cutoff adjusts common cutoff voltage. batch-adjust three axes. when left open, biased 2.5v. when voltage is adjusted to 2.5v, cutoff voltage is 5v (typ.). dc input 0 to 5v cutoff voltage : 10 to 0v 27 brightness adjusts brightness. batch adjusts three axes. when left open, biased 3.3v. when voltage is adjusted to 3.3v, brightness voltage is 0v (typ.), center. dc input 0 to 5v brightness voltage : 3.8 to ? 2v 28 30 b drive r drive fine-adjusts drive voltage for b / r axis. when left open, biased 2.5v. when voltage is adjusted to 2.5v, drive voltage adjustment is 0% (typ.). dc input 0 to 5v output amplitude : 45 to 150%
TA1204AF 2001-02-07 7/25 pin no. pin name function interface circuit input / output signal 29 com drive adjusts drive voltage. batch-adjusts three axes. do not leave open. dc input 1.2 to 4.5v output amplitude : 1.4 to 11v p-p 31 v cc (+5v) v cc pin connect 5v (typ.). connect bypass capacitor near this pin. D D 32 34 36 b in (a) g in (a) r in (a) input r / g / b (a) signal. in clamp mode, input via clamp capacitor. 100ire = 0.7v p-p clamp mode dc mode 33 contrast adjusts contrast. batch-adjusts three axes. do not leave open. dc input 1.7 to 4.1v signal amplitude : ? 30db or below to 7db
TA1204AF 2001-02-07 8/25 pin no. pin name function interface circuit input / output signal 35 b clamp fil. connect b-axis input pedestal offset cancel filter. use g-axis pedestal as reference. 37 g clamp fil. connect g-axis input pedestal offset cancel filter. use brightness adjustment voltage as reference. 41 r clamp fil. connect r-axis input pedestal offset cancel filter. use g-axis pedestal as reference. dc 38 40 42 b in (b) g in (b) r in (b) input rgb (b) signal. in clamp mode, input via clamp capacitor. 100ire = 0.7v p-p clamp mode 39 gnd gnd pin for block to which power is supplied from v cc pin. connect to 5 and 17 gnd pins using short thick line. D D 1 43 -r cont -b cont fine-adjusts r / b-axis characteristic. when left open, biased 3.7v. when voltage is adjusted to 3.7v, adjustment is typically 78% (at 60% white input). dc input 0 to 5v adjustment : 66 to 78% (at 60% white input) 44 -com cont adjusts common characteristic. batch-adjusts three axes. when left open, biased 2.5v. when voltage is adjusted to 2.5v, adjustment is typically 72% (at 60% white input). dc input 0.9 to 4.9v adjustment : 82 to 60% (at white 60% input)
TA1204AF 2001-02-07 9/25 maximum ratings (ta = 253c) characteristic symbol rating unit supply voltage 1 v dd 15 v supply voltage 2 v cc 8 v power dissipation p dmax. 960 (note 1) mw input signal voltage e in gnd ? 0.3~v cc +0.3 gnd ? 0.3~v dd +0.3 v operating temperature t opr ? 20~65 c storage temperature t stg ? 55~150 c note 1 : see figure below. note 2 : pin34, 36, 38, 40 and pin42 are weak against static electricity and surge impulse. please take counter measure to meet, if necessary. figure temperature decrease curve of power dissipation recommended supply voltage pin no. pin name min typ. max unit 9 v dd 12.5 13.0 13.5 v 31 v cc 4.5 5.0 5.5 v
TA1204AF 2001-02-07 10/25 electrical characteristics (unless otherwise specified, v cc = 5.0v, v dd = 13.0v, ta = 253c) dc characteristics characteristic symbol test cir- cuit test condition min typ. max unit supply current 1 i cc D D 17.6 22.0 29.3 ma supply current 2 i dd D D 13.6 17.0 22.7 ma -r cont. v 1 D D 3.5 3.7 3.9 v comm cent. v 8 D D 4.8 5.0 5.2 v comm f.b. v 10 D D 4.6 5.0 5.4 v comm amp v 11 D D 2.3 2.5 2.7 v comm out v 12 D D 4.65 5.05 5.45 v r fbl v 13 D D 2.65 3.05 3.45 v r out v 14 D D 6.2 6.5 6.8 v r fbh v 15 D D 2.6 3.0 3.4 v g fbl v 16 D D 2.65 3.05 3.45 v g fbh v 18 D D 2.6 3.0 3.4 v g out v 19 D D 6.2 6.5 6.8 v b fbl v 20 D D 2.65 3.05 3.45 v b out v 21 D D 6.2 6.5 6.8 v b fbh v 22 D D 2.6 3.0 3.4 v v 0 cent v 23 D D 6.3 6.5 6.7 v r cutoff v 24 D D 2.3 2.5 2.7 v com cutoff v 25 D D 2.3 2.5 2.7 v b cutoff v 26 D D 2.3 2.5 2.7 v brightness v 27 D D 3.1 3.3 3.5 v b drive v 28 D D 2.3 2.5 2.7 v r drive v 30 D D 2.3 2.5 2.7 v b in1 v 32 D D 0.7 0.9 1.1 v g in1 v 34 D D 0.7 0.9 1.1 v b clamp fil. v 35 D D 2.2 2.8 3.4 v r in1 v 36 D D 0.7 0.9 1.1 v g clamp fil. v 37 D D 2.2 2.8 3.4 v b in2 v 38 D D 0.7 0.9 1.1 v g in2 v 40 D D 0.7 0.9 1.1 v r clamp fil. v 41 D D 2.2 2.8 3.4 v r in2 v 42 D D 0.7 0.9 1.1 v -b cont. v 43 D D 3.5 3.7 3.9 v -com cont. v 44 D D 2.3 2.5 2.7 v
TA1204AF 2001-02-07 11/25 ac characteristics characteristic symbol test cir- cuit test condition min typ. max unit rgb input dynamic range a in D (note 1) 1.5 1.8 2.1 v cross talk between channels x ch D (note 2) D ? 60 ? 46 db crosstalk over switching circuit x sw D (note 3) D ? 60 ? 50 db typical s out D 2.9 3.3 3.7 v 0-p deviation ? s o D D D 250 mv output signal amplitude polarity gap ? s op D (note 4) D D 100 mv max. gain a cm D 5.6 6.7 7.6 db contrast adj. deviation ? a cm D (note 5) D D 0.5 db typical b rs D ? 0.33 ? 0.17 ? 0.01 v deviation ? b rs D (note 6) D D 100 mv max. gain b rm D 3.2 3.8 4.4 v max. deviation ? b rm D (note 7) D D 200 mv min. gain b rl D ? 2.6 ? 2.1 ? 1.5 v brightness adj. min. deviation ? b rl D (note 8) D D 200 mv typical level c os D 4.6 5 5.4 v typical deviation ? c os D (note 9) D D 100 mv max. range c om D 9.3 9.8 10.3 v max. deviation ? c om D (note 10) D D 100 mv min. range c ol D 0 0.07 0.5 v cut-off min. deviation ? c ol D (note 11) D D 100 mv max. c vm D 1.7 1.95 2.1 min. c vl D ? 2.1 ? 1.95 ? 1.8 v cut-off fine adjustment range deviation ? c vp D (note 12) D D 250 mv max. c om D 10.6 11.15 11.7 v max. deviation ? c om D (note 13) D D 150 mv min d ol D 0.95 1.35 1.75 v drive output amplitude min. deviation ? d ol D (note 14) D D 150 mv max. c vm D 145 151.5 157 min. c vl D 39 45.5 52 drive fine adjustment deviation ? c vp D (note 15) D D 5 %
TA1204AF 2001-02-07 12/25 characteristic symbol test cir- cuit test condition min typ. max unit output frequency response f out D 8 12 D output frequency response deviation ? f out D (note 16) D D 0.5 mhz output dynamic range a out D (note 17) 10.6 11.15 11.7 v p-p output through rate sr s D (note 18) 50 65 D v /s output s / n sn D (note 19) 50 D D db typical v os D 6.18 6.48 6.78 v polarity reverse center voltage deviation ? v os D (note 20) D D 100 mv max. variable range v om D 11.08 11.38 11.58 min. variable range v ol D 0.74 0.94 1.14 v polarity reverse center voltage deviation ? v oml D (note 21) D D 100 mv typical g s D 67 72 77 % deviation ? g s D D D 5 % characteristic polarity gap ? g sp D (note 22) D D 3 % max. g sm D 75 81.5 85 min. g sl D 57 60 63 % characteristic variable range deviation ? g sml D (note 23) D D 53 % max. g vm D 73 78 83 min. g vl D 61 66 71 % fine adjustment characteristic variable range deviation ? g vml D (note 24) D D 5 % common drive output typical amplitude s cs D (note 25) 4.6 5.1 5.6 v p-p max. s cm D 8.1 8.8 8.9 common drive output amplitude variable range min. s cl D (note 26) D 0 0.5 v typical common drive center voltage v cs D (note 27) 4.7 5 5.2 v max. v cm D 10.7 11 11.3 common drive center voltage variable range min. v cl D (note 28) 0.1 0.27 0.5 v common drive output through rate sr c D (note 29) 5 9 D v /s clamp signal input threshold 1 v cp1 D (note 30) 1.2 1.4 1.6 v clamp signal input threshold 2 v cp2 D (note 31) 3.3 3.5 3.7 v input-switching signal threshold v sel D (note 32) 2.3 2.5 2.7 v polarity reverse signal threshold v pol D (note 33) 2.4 2.6 2.8 v polarity reverse phase-switching signal threshold v inv D (note 34) 2.6 2.8 3 v
TA1204AF 2001-02-07 13/25 method of measurement note 1: image signal input dynamic range ? test condition 2 (direct-coupling mode) ? input : g in1 / g in2 test signal 1 for input a, measure the peak levels at input pins 32 {34, 36} immediately before the top / down clipping of the output signals of output pins 21 {19, 14}, while adjusting vr34 and changing the pedestal levels at the end of the input pin. specify the difference between the upper and lower measurement values as the dynamic range to be obtained. for input b, change sw 2b from a to b, adjust vr40, and take the same measurements for input pins 38 {40, 42}. note 2: inter-channel crosstalk 1 ? test condition 5 (cp mode, fixed polarity) ? input : x in1 / x in2 test no. 2 measurement frequency 1mhz ? other input pins (y in1 z in1 / y in2 z in2) : short to gnd change sw 27 from a to b as before, and adjust vr27 so there is no difference between the 0 and black levels in the output waveform at pin 19. for input a, input it to the x-axis (pin x in1) and measure the amplitude values of the 1mhz components at output pins 21, 19, and 14. short to gnd the other input pins (y in1 / z in1). crosstalk from the x-axis to the y-axis = (amplitude value of the y-axis output) / (amplitude value of the x-axis output) crosstalk from the x-axis to the z-axis = (amplitude value of the z-axis output) / (amplitude value of the x-axis output) change the combination of x, y, and z among b (output pin 21), g (output pin 19), and r (output pin 14), and repeat the same measurement. for the b input, change sw 2b from a to b, set the input pin at binx, short to gnd the other input pins (y in2 / z in2), and measure as for input a. note 3: switched sw crosstalk ? test condition 5 (cp mode, fixed polarity) ? input : x in1 (x in2 = short to gnd) / x in2 (x in1 = short to gnd) test signal 2 measurement frequency 1mhz change sw 27 from a to b as before, adjust vr27 so there is no difference between the 0 level and the black level in the output waveform of pin 19, input it to the channel a x-axis (pin x in1), switch sw 2b from a to b, and measure the amplitude value of the 1mhz component of the x-axis output pins (pin 21 when x = b, pin 19 when x = g, and pin 14 when x = r) before and after switching. crosstalk from input a to input b = (amplitude value when sw = b) / (amplitude value when sw = a) change the input pin to channel b (pin x in2) and repeat the same measurement. crosstalk from input b to input a = (amplitude value when sw = a) / (amplitude value when sw = b) repeat this measurement replacing b, g, and r as the x-axis. note 4: typical amplitude for signal outputs, inter-axis amplitude deviation, and polarity difference ? test condition 4 (cp mode) ? input : x in1 test signal 3 input signals (0.7v p-p ) including black and white levels at input a (x in1). measure the amplitudes between the black and white waveform levels at output pins (pin 21 when x = b, pin 19 when x = g, and pin 14 when x = r) for positive and negative polarities. repeat this measurement replacing b, g, and r as the x-axis.
TA1204AF 2001-02-07 14/25 note 5: maximum amount of contrast adjustment, inter-axis deviation ? test condition 4 (cp mode) ? input : x in1 test signal 3 ? vr33 : max (pin 33 5v) change sw 33 from a to b, and adjust vr33 until 5v is applied to pin 33. input a signal (0.7v p-p ) including black and white levels at input a. measure the amplitudes between the black and white waveform levels at output terminals (pin 21 when x = b, pin 19 when x = g, and pin 14 when x = r). calculate their ratio with the typical signal output amplitude and express it in db units. repeat this measurement replacing b, g, and r as the x-axis. note 6: typical amount of brightness adjustment, inter-axis deviation ? test condition 4 (cp mode) ? input : x in1 test signal 3 input a signal (0.7v p-p ) including black and white levels to input a. measure the voltage difference between the black and 0 waveform levels for an output pin (pin 21 when x = g, pin 19 when x = g, and pin 14 when x = r) for positive and negative polarities. repeat this measurement replacing b, g, and r as the x-axis. note 7: maximum amount of brightness adjustment, inter-axis difference ? test condition 4 (cp mode) ? input : x in1 test no. 3 ? vr27 : max (pin 27 0v) change sw 27 from off to on, and adjust vr27 until 0v is applied to pin 27. input a signal (0.7v p-p ) including black and white levels in input a (x in1). measure the voltage difference between the black and 0 waveform levels for an output pin (pin 21 when x = b, pin 19 when x = g, and pin 14 when x = r). repeat this measurement replacing b, g, and r as the x-axis. note 8: minimum amount of brightness adjustment ? test condition 4 (cp mode) ? input : x in1 test signal 3 change sw 27 from off to on, and adjust vr27 until 5v is applied to pin 27. input a signal (0.7v p-p ) including black and white levels to input a (x in1). measure the voltage difference between black and 0 waveform levels for an output pin (pin 21 when x = b, pin 19 when x = g, and pin 14 when x = r). repeat this measurement replacing b, g, and r as the x-axis. note 9: typical cut-off level, inter-axis deviation ? test condition 4 (cp mode) ? input : x in1 test signal 3 input a signal (0.7v p-p ) including black and white levels to input a (x in1). measure the voltage difference between the 0 levels of the positive and negative polarity outputs in an output pin (pin 21 when x = b, pin 19 when x = g, and pin 14 when x = r). repeat this measurement replacing b, g, and r as the x-axis. note 10: maximum range of cut-off adjustment, inter-axis deviation ? test condition 4 (cp mode) ? input : x in1 test signal 3 ? vr25 : max (pin 25 0v) change sw 25 from off to on, and adjust vr25 fully until 0v is applied to pin 25. input a signal (0.7v p-p ) including black and white levels to input a (x in1). measure the voltage difference between the 0 level of the positive output and that of the negative output in an output pin (pin 21 when x = b, pin 19 when x = g, and pin 14 when x = r). repeat this measurement replacing b, g, and r as the x-axis.
TA1204AF 2001-02-07 15/25 note 11: minimum range of cut-off adjustment, inter-axis deviation ? test condition 4 (cp mode) ? input : x in1 test signal 3 ? vr25 : min (pin 25 5v) change sw 25 from off to on, and adjust vr25 fully until 5v can be applied to pin 25. input a signal (0.7v p-p ) including black and white levels to input a (x in1). measure the voltage difference between the 0 level of the positive output and that of the negative output in an output pin (pin 21 when x = b, pin 19 when x = g, and pin 14 when x = r). repeat this measurement replacing b, g, and r as the x-axis. note 12: maximum cut-off fine adjustment range value, inter-axis deviation ? test condition 4 (cp mode) ? input : x in1 (x = b or r) test signal 3 x = b : vr26 : min / max (pin 26 0v / 5v) x = r : vr24 : min / max (pin 24 0v / 5v) when measuring channel b (x = b), change sw 26 from off to on, and input a signal (0.7v p-p ) including black and white levels in input a (b in1). turn vr26 clockwise and anticlockwise and measure the maximum value (when pin 26 = 5v and pin 26 = 0v) of the voltage difference from the 0 levels of the positive and negative polarity outputs of an output pin (pin 21). obtain the voltage difference from the no. 15 standard cut-off level of each voltage. for channel r (x = r), change sw 24 from off to on, turn vr24 clockwise and anticlockwise, and make the same measurement as for channel b with output pin (14) using r in1 as the input pin. note 13: maximum value of drive output amplitude adjustment, inter-axis deviation ? test condition 4 (cp mode) ? input : x in1 test signal 3 ? vr29 : max change sw 25 from a to b, and adjust vr25 until 0v is applied to pin 25. input a signal (0.7v p-p ) including black and white levels in input a (x in1). change sw29 from a to b, raise the voltage applied to pin 29 by adjusting vr29, and measure the amplitude value when the waveform amplitude stops increasing from the black to the white level for an output pin (pin 21 when x = b, pin 19 when x = g, and pin 14 when x = r) for positive and negative polarity outputs. note 14: minimum value of drive output amplitude adjustment, inter-axis deviation ? test condition 4 (cp mode) ? input : x in1 test signal 3 ? vr29 : min input a signal (0.7v p-p ) including black and white levels in input a (x in1). change sw 29 from a to b, lower the voltage applied to pin 29 by adjusting vr29, and measure the amplitude value when the waveform amplitude stops decreasing from the black to the white level at an output pin (pin 21 when x = b, pin 19 when x = g, and pin 14 when x = r) in positive and negative polarity outputs. note 15: maximum and minimum drive fine adjustment values, inter-axis deviation ? test condition 4 (cp mode) ? input : x in1 (x = b or r) test signal 3 x = b : vr28 : min / max (pin 28 0v / 5v) x = r : vr30 : min / max (pin 30 0v / 5v) when measuring channel b, change sw 28 from off to on, and input a signal (0.7v p-p ) including white and black levels in input a (b in1). turn vr28 clockwise and anticlockwise and measure the maximum value (when pin 28 = 5v) and the minimum value (on condition of pin 28 = 0v) of the voltage difference between the black and the white level of an output pin (pin 21). obtain the ratio between the black and white levels of the output pin (pin 19) of each voltage. when measuring channel p (x = r), change sw 30 from off to on, and take the same measurement as for the channel b for an output pin (pin 14) by turning vr30 clockwise and anticlockwise, with r in1 as the input pin.
TA1204AF 2001-02-07 16/25 note 16: signal frequency characteristics, inter-axis deviation ? test condition 5 (cp mode, fixed polarity) ? input : x in1 test signal 2 (sweep) input test signal 2 to x in1, raise its frequency from 500khz to 20mhz, and observe the amplitudes of the frequency components. measure the frequency for a 3db fall in output amplitude. take the same measurements as for positive polarity by changing sw 7b from a to b. note 17: output dynamic range ? test condition 4 (cp mode) ? input : x in1 test signal 3 ? vr23 : max / min input a signal (0.7v p-p ) including black and white levels to input a (x in1). change sw 23 from a to b, raise and lower the voltage applied to pin 23 by turning vr23 clockwise and anticlockwise, measure the maximum and minimum black waveform levels for an output pin (pin 21 when x = b, pin 19 when x = g, and pin 14 when x = r), and thus obtain the voltage difference. note 18: signal output through-rate ? test condition 4 (cp mode) ? input : x in1 test signal 5 input to input a (x in1) a test signal whose 10 to 90% rise / fall times are less than 50ns in a rectangular waveform that repeats black and white levels. measure the 10 to 90% rise / fall times in the waveform of the output pin (pin 21 when x = b, pin 19 when x = g, and pin 14 when x = r), and convert this to a through-rate. note 19: signal output s / n ? test condition 5 (cp mode, fixed polarity) ? input : no signal noise measurement band dc to 6mhz change sw 27 from a to b, and adjust vr27 while looking at the waveform of an output pin (pin 21, pin 19, pin 14) so that the difference between the 0 and black levels becomes 0. measure the noise voltage (measurement band: ~6mhz) of the output pins in this state. repeat this measurement for each output pin. calculate the ratio of the no. 9 typical output amplitude to the measured noise voltage, and express it in db units. for a positive polarity measurement, repeat the above measurement by changing sw 7b from a to b. note 20: reversed polarity center voltage, typical value, inter-axis deviation ? test condition 4 (cp mode) ? input : no signal measure the 0 levels of the positive and negative polarities of the output waveform at an output pin (pin 21 when x = b, pin 19 when x = g, and pin 14 when x = r), and measure the mean value of the two levels. repeat this measurement replacing b, g, and r as the x-axis. note 21: reversed polarity center voltage, maximum and minimum variable ranges, inter-axis deviation ? test condition 4 (cp mode) ? input : no signal ? vr23 : max / min change sw 25 from a to b, adjust vr26 and set the voltage applied to pin 25 at 5v, thereby minimizing the cut-off. change sw 23 from a to b, raise and lower the voltage applied to pin 23 by turning vr23 clockwise and anticlockwise. obtain the center voltage of the positive and negative 0 levels when the waveform of an output pin (pin 21 when x = b, pin 19 when x = g and pin 14 when x = r) approaches v dd and stops rising, and set this as the maximum value. obtain the center voltage of positive and negative 0 levels when the waveform of the output pin approaches gnd and these levels stop decreasing, and make this voltage the minimum value. repeat this measurement replacing b, g, and r as the x-axis.
TA1204AF 2001-02-07 17/25 note 22: typical characteristics, inter-axis deviation, polarity difference ? test condition 4 (cp mode) ? input : x in1 test signal 3 input test signal 3 including black, white, and 60% levels to input a (x in1). measure the voltage difference (set at 1) between the white and black levels and the voltage difference (set at 2) between the 60% input and black levels in the waveform of an output pin (pin 21 when x = b, pin 19 when x = g, and pin 14 when x = r). obtain a voltage difference ratio of 2:1. repeat for the positive and negative polarity outputs. repeat this measurement replacing b, g, and r as the x-axis. note 23: characteristic variable range, maximum and minimum-characteristic variable range, inter-axis deviation ? test condition 4 (cp mode) ? input : x in1 test signal 3 ? vr44 : max / min (pin 44 0v / 5v) input test signal 3 including black, white, and 60% levels to input a (x in1). change sw 44 from a to b, adjust vr44 and set the voltage applied to pin 44 at 0v, thereby maximizing the control. measure the voltage difference (set to 1) between the white and black waveform levels for an output pin (pin 21 when x = b, pin 19 when x = g, and pin 14 when x = r) and the voltage difference (set at 2) between the 60% input and black levels. obtain a voltage difference ratio of 2:1 and set this as the maximum value for the characteristics. next, adjust vr44 in the opposite direction, set the voltage applied to pin 44 to 5v, and thus minimize the control. obtain a voltage difference ratio of 2:1 as for the measurement of the maximum value, and set this as the minimum value of the characteristics. repeat this measurement replacing b, g, and r as the x-axis. note 24: fine adjustment characteristic variable range, maximum and minimum fine adjustment characteristic variable ranges, inter-axis deviation ? test condition 4 (cp mode) ? input : x in1 (x = b or r) test signal 3 x = b : vr43 : max / min (pin 43 5v / 2.5v) x = r : vr1 : max / min (pin 1 5v / 2.5v) when measuring channel b, change sw 43 from off to on, and input test signal 3 including black, white, and 60% levels to input a (b in1). turn vr43 fully, set the voltage applied to pin 43 at 5v, and thus maximize the control. measure the voltage difference (fixed at 1) between white and black waveform levels for output pin 21 and the voltage difference (fixed at 2) of 60% input and black levels. obtain a voltage difference ratio of 2:1 and set this as the maximum value of the characteristics. next, set the voltage applied to pin 43 to 2.5v by turning vr43 fully in the opposite direction, thereby minimizing the characteristics. obtain a voltage difference ratio of 2:1 and thereby minimize the value of the characteristics in the same way the maximum value was measured. when measuring channel r (x = r) change sw 1 from off to on, turn vr1 clockwise and anticlockwise with r in1 as the input pin, and thus measure output pin 14 in the same way as channel b. note 25: typical amplitude of common electrode signals ? test condition 4 ? input : no signal measure the voltage difference between h and l levels in the output waveform of pin 10. note 26: amplitude of common electrode signals, maximum variable range, amplitude of common electrode signals, minimum variable range ? test condition 4 ? input : no signal measure the voltage difference between h and l waveform levels for pin 10 output when terminal 11 is shorted to gnd, and thus set this as the maximum amplitude. measure the voltage difference between the h and l levels for the output waveform of pin 10 when pin 11 is shorted with v cc (%v), and set this as the minimum amplitude.
TA1204AF 2001-02-07 18/25 note 27: typical common electrode signal center voltage ? test condition 4 ? input : no signal obtain the mean value of h and l levels in the output waveform at pin 10 and set this as the center voltage. note 28: maximum and minimum common electrode signal center voltage variable ranges ? test condition 4 ? input : no signal ? vr8 : max / min keep pin 11 shorted with v cc (5v). change sw 8 from off to on, turn vr8 clockwise and anticlockwise and thus obtain the upper limit (maximum center voltage) and the lower limit (minimum center voltage) in a potential change at pin 10. note 29: common electrode signal output through-rate ? test condition 4 ? input : no signal measure the 10 to 90% rise and fall times in the change between the h and l levels for the output waveform of pin 10, and convert these into through-rates. note 30: clamp signal output, threshold 1 ? test condition 6 adjust vr34 and vr40 so that the voltage at pins 34 and 40 becomes 0.9v. gradually raise from 0v the direct current voltage applied to cp a in (pin 3), and measure the voltage at cp a in when the normal voltage of 9.00.4v is output from g output pin (pin 19). change sw 2m from a to b, and make similar measurements for cp b in (pin 4). note 31: clamp signal input threshold 2 ? test condition 4 (cp mode) ? input : no signal change to dc the cp that is applied to cp a in (pin 3), gradually raise its voltage from 2.5v, and measure the voltage at cp a in (pin 3) when the voltage of channel a g input pin (pin 3) is clamped at 0.90.1v. change sw 2b from a to b, and make similar measurements for cp b in (pin 4), at channel b g input pin (pin 40). note 32: input-switching signal threshold ? test condition 2 (direct coupling mode) ? input : no signal adjust vr34 and vr40 so that the voltage of pin 34 is 0.9v and that of pin 40 at 1.6v. change sw 2a from a to b, gradually raise from 0v the dc voltage at a / b select (pin 2), and measure the pin 2 voltage when the output signal of g output pin 19 changes from the white level to the black level. (voltage difference from the 0 level must be within 0.4v.) note 33: reversed polarity signal threshold ? test condition 5 (cp mode, fixed polarity) ? input : no signal change sw 7a from a to b, gradually raise from 0v the dc voltage applied at pol ln pin (7), and measure the pin 7 voltage when the output voltage of g output pin 19 exceeds 6.5v (rapidly rising from about 4v to about 9v). note 34: reversed polarity phase-switching signal threshold ? test condition 5 (cp mode, fixed polarity) ? input : no signal change sw 6a from a to b, gradually raise from 0v the dc voltage applied at pin 6, and measure the pin 6 voltage at the time the output voltage of g output pin 19 exceeds 6.5v (rapidly rising from about 4v to about 9v).
TA1204AF 2001-02-07 19/25 electrical characteristics list of setup test condition pin / func- tion 1 2 3 4 6 7 8 11 23 24 25 26 27 sw / vr -r cont. a / b select cp a in cp b in v inv. pol in comm cent. comm amp v 0 cent. r cutoff com cutoff b cutoff bright -ness sw a off a b b a b off off off off off off off sw b a a a a a vr sig pin / func- tion 28 29 30 32 33 34 36 38 40 42 43 44 sw / vr b drive com drive r drive b in1 con- tast g in1 r in1 b in2 g in2 r in2 -b cont. -com cont. sw a off a off a a on a a on a off off sw b off off off off off off test condition 1 (no signal, non- operative) vr sig pin / func- tion 1 2 3 4 6 7 8 11 23 24 25 26 27 sw / vr -r cont. a / b select cp a in cp b in v inv. pol in comm cent. comm amp v 0 cent. r cutoff com cutoff b cutoff bright -ness sw a off a b b a b off off off off off off off sw b a a a a a vr sig cp1 cp1 pol pin / func- tion 28 29 30 32 33 34 36 38 40 42 43 44 sw /vr b drive com drive r drive b in1 con- tast g in1 r in1 b in2 g in2 r in2 -b cont. -com cont sw a off a off b a on b b on b off off sw b off on off off on off test condition 2 (dc coupling, typical operation) vr sig (sig) (sig)
TA1204AF 2001-02-07 20/25 pin / func- tion 1 2 3 4 6 7 8 11 23 24 25 26 27 sw / vr -r cont. a / b select cp a in cp b in v inv. pol in comm cent. comm amp v 0 cent. r cutoff com cutoff b cutoff bright -ness sw a off a b b a a off off off off off off off sw b a a a a a vr sig cp1 cp1 pin / func- tion 28 29 30 32 33 34 36 38 40 42 43 44 sw / vr b drive com drive r drive b in1 con- tast g in1 r in1 b in2 g in2 r in2 -b cont. -com cont. sw a off a off b a on b b on b off off sw b off on off off on off test condition 3 (dc coupling, fixed polarity) vr sig (sig) (sig) pin / func- tion 1 2 3 4 6 7 8 11 23 24 25 26 27 sw / vr -r cont. a / b select cp a in cp b in v inv. pol in comm cent. comm amp v 0 cent. r cutoff com cutoff b cutoff bright -ness sw a off a b b a b off off off off off off off sw b a a a a a vr sig cp2 cp2 pol pin / func- tion 28 29 30 32 33 34 36 38 40 42 43 44 sw /vr b drive com drive r drive b in1 con- tast g in1 r in1 b in2 g in2 r in2 -b cont. -com cont. sw a off a off a a on a a on a off off sw b off off off off off off test condition 4 (clamp, typical operation) vr sig (sig) (sig) (sig) (sig) (sig) (sig)
TA1204AF 2001-02-07 21/25 pin / func- tion 1 2 3 4 6 7 8 11 23 24 25 26 27 sw / vr -r cont. a / b select cp a in cp b in v inv. pol in comm cent. comm amp v 0 cent. r cutoff com cutoff b cutoff bright -ness sw a off a b b a a off off off off off off off sw b a a a a a vr sig cp2 cp2 pin / func- tion 28 29 30 32 33 34 36 38 40 42 43 44 sw / vr b drive com drive r drive b in1 con -tast g in1 r in1 b in2 g in2 r in2 -b cont. -com cont. sw a off a off a tast on a a on a off off sw b off off off off off off test condition 5 (clamp, fixed polarity) vr sig (sig) (sig) (sig) (sig) (sig) (sig) pin / func- tion 1 2 3 4 6 7 8 11 23 24 25 26 27 sw / vr -r cont. a / b select cp a in cp b in v inv. pol in comm cent. comm amp v 0 cent. r cutoff com cutoff b cutoff bright -ness sw a off a b b a a off off off off off off off sw b a a a a a vr sig dc dc pin / func- tion 28 29 30 32 33 34 36 38 40 42 43 44 sw /vr b drive com drive r drive b in1 con- tast g in1 r in1 b in2 g in2 r in2 -b cont. -com cont. sw a off a off b a on b b on b off off sw b off on off off on off test condition 6 (vthcp) vr sig (sig) (sig) (sig) (sig) (sig) (sig) note 1: this setup is based on the initial setup condition before starting various measurements. note 2: symbols a, b, on, and off show the sw setup. note 3: the underlined setup shows that it is to be changed when the setup of test condition 1 is specified as default. note 4: the signal names in the sig column (cp1, cp2, pol ) show that the specified signals are applied on a fixed basis. (sig) applies signals to any one pin according to items.
TA1204AF 2001-02-07 22/25 control signal and test signal
TA1204AF 2001-02-07 23/25 test circuit
TA1204AF 2001-02-07 24/25
TA1204AF 2001-02-07 25/25 package dimensions weight: 1.15g (typ.)


▲Up To Search▲   

 
Price & Availability of TA1204AF

All Rights Reserved © IC-ON-LINE 2003 - 2022  

[Add Bookmark] [Contact Us] [Link exchange] [Privacy policy]
Mirror Sites :  [www.datasheet.hk]   [www.maxim4u.com]  [www.ic-on-line.cn] [www.ic-on-line.com] [www.ic-on-line.net] [www.alldatasheet.com.cn] [www.gdcy.com]  [www.gdcy.net]


 . . . . .
  We use cookies to deliver the best possible web experience and assist with our advertising efforts. By continuing to use this site, you consent to the use of cookies. For more information on cookies, please take a look at our Privacy Policy. X